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Keysight (Agilent) N5230A PNA-L 4-Port Network Analyzer, 300 kHz to 20 GHz

Keysight (Agilent) N5230A PNA-L 4-Port Network Analyzer, 300 kHz to 20 GHz

Product Documentation

Description

The standard Keysight (Agilent) N5230A PNA-L 4-Port Network Analyzer, 300 kHz to 20 GHz, is suitable for testing passive and active devices such as filters and amplifiers. Users can easily add options to test mixers, harmonics, intermodulation distortion (IMD), pulsed-RF, antennas and millimeter-wave (mmwave) components.

Features of the Keysight (Agilent) N5230A:

  • Integrated 4-port, balanced measurements
  • 103 dB dynamic range and < 0.004 dB trace noise
  • 4.5 usec/point measurement speed, 32 channels, 16,001 points
  • Automatic port extension automatically corrects for in-fixture measurements
  • Optional second internal source for fast measurements of amplifier intermodulation distortion and mixer/converter conversion loss

Capabilities of the Keysight (Agilent) N5230A:

  • Mixer Measurements:
    • Conversion loss/gain, magnitude and phase
    • Input match, output match, and LO match
    • Isolation and compression
    • The two internal independent synthesizers with +13 dBm power and < 60 dBc harmonics eliminate the need for external synthesizers or components.
    • Advanced error correction
    • Patented vector-mixer calibration for measurement of absolute group delay
    • Scalar-mixer calibration (SMC) for match-corrected amplitude measurements
    • Signiicantly faster speed for ixed-IF (20 to 30 times faster than with an external source)
    • Easy-to-conigure multi-stage converter measurements
    • LO source control and LO power calibration
    • Mixer IMD
    • The simple two-step SMC calibration provides match-corrected conversion loss, error-corrected input and output match
    • Software tuning for embedded LO
  • Amplifier Measurements:
    • Gain, gain latness, reverse isolation, and return loss
    • Simple, fast, and accurate AM-AM and AM-PM compression measurements with the Gain Compression Application with 38 dB power sweep range at 20 GHz, +13 dBm output power
    • Test harmonics accurately with < 60 dBc source harmonics. No need for external filters.
    • Accurate and simple IMD using the dual sources and internal combiner, located behind the couplers, providing highly accurate and stable measurements. No need for external combiners.
    • Source corrected noise igure measurements with exceptional accuracy
    • Integrated source attenuators and receiver attenuators for measurement optimization
    • Perform all of the above measurements with one single connection using the PNA–X.
  • Pulsed-RF Measurements:
    • Wideband and narrowband detection
    • Up to four internal pulse generators
    • Up to two internal pulse modulators
    • Pulse widths as narrow as 33 ns
    • Pulse-to-pulse
    • Point-in-pulse, average pulse, and pulse-proile capability
    • No need for external components
  • Basic Measurements:
    • Insertion loss, gain, return loss, isolation, group delay, compression, both magnitude and phase
    • Connectorized, in-ixture, or on-wafer
    • Fast and accurate
    • Reliable and repeatable
    • Affordable
  • On-wafer Measurements:
    • Class of TRL calibrations for accurate measurements
    • Differential measurement capabilities with integrated multiport network analyzers
    • Accurate power control and de-embedding algorithm for device characterization
    • Compatibility with on-wafer calibration software for a total solution
  • Differential Measurements:
    • Single-ended, balanced, mixed-mode
    • S-parameters
    • Ratioed and unratioed measurements
    • Mode-conversion analysis
    • True-mode stimulus measurements
  • Multiport Measurements:
    • Multiport conigurations optimized for your device, including full cross-bar
    • Quick-Short-Open-Load-Thru (QSOLT) for fast, multiport cal
    • N-port calibration for accuracy and ease-of-measurements
    • Test-set control part of PNA irmware
    • 32 independent channels for fast measurement speed

Contact TestWorld today for the best price on a Keysight (Agilent) N5230A PNA-L 4-Port Network Analyzer, 300 kHz to 20 GHz.

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Configurable Options for the Keysight (Agilent) N5230A:

  • N5230A-140, 300 kHz to 13.5 GHz, 4-port with standard test set and standard power range
  • N5230A-145, 300 kHz to 13.5 GHz, 4-port with configurable test set and extended power range
  • N5230A-146, 300 kHz to 13.5 GHz, 4-port with configurable test set and extended power range with internal second source
  • N5230A-240, 300 kHz to 20 GHz, 4-port with standard test set and standard power range
  • N5230A-245, 300 kHz to 20 GHz, 4-port with configurable test set and extended power range
  • N5230A-246, 300 kHz to 20 GHz, 4-port with configurable test set and extended power range with internal second source
  • Additional Options:
    • N5230A-010: Time-domain capability: This option enables the PNA Series to view reflection and transmission responses in both time or distance domain. Use time domain to tune filters, gate out the response of fixtures and cables, characterize the impedance of transmission line, and more.
    • N5230A-080: Frequency Offset: This option enables the PNA Series to set the source frequency independently from where the receivers are tuned. This ability is important for two general classes of devices: mixers (and converters) and amplifiers.
    • N5230A-082 Scalar-calibrated converter measurements: With a simple setup and calibration, this application provides the highest accuracy for conversion-loss (or gain) measurements by combining one-port and power-meter calibrations to remove mismatch errors. Option 080 required.
    • N5230A-550: 4-port measurement application: Enables full 4-port error correction and differential measurements on a 2-port network analyzer with configurable test set (Option x25). External test set required. User installable.
    • N5230A-551: N-port capabilities: Adds full N-port error correction and measurement capabilities to any PNA-L network analyzer with configurable test set (Option xx5 or x46). External test set required. User installable.

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