Description
Features and Specifications of Keysight (Agilent/HP) 81160A:
- 1 μHz – 330 MHz pulse generation with variable rise/fall time
- 1 μHz – 500 MHz sine waveform output
- 14-bit, 2.5 GSa/s arbitrary waveforms
- Up to 256k samples deep arbitrary waveform memory per channel
- Pulse, sine, square, ramp, noise and arbitrary waveforms
- Noise, with selectable crest factor, and signal repetition time of 20 days
- FM, AM, PM, PWM, FSK modulation capabilities
- 1 or 2 channel, coupled and uncoupled
- Differential outputs
- Amplitude:
- 50 Ω into 50 Ω 50 mVPP to 5 VPP
- 50 Ω into open 100 mVPP to 10 VPP
- Voltage window:
- 50 Ω into 50 Ω ± 5 V
- 50 Ω into open ± 10 V
- Glitch free change of timing parameters (delay, frequency, transition time, width, duty cycle)
- Programming language compatible with Keysight 81101A, 81104A, 81105A , 81110A, 81130A and 81150A
- ISO 17025 and Z540.3 calibration
- LXI class C (rev 1.1) compliant
- Optional pattern generator:
- Ideal and arbitrary bit shaped pattern up to 330 Mbit/s (Option 330) or 660 Mbit/s (Option 660)
- Two, three or four level signals
- PRBS up to 231
- 4 Mbit pattern memory for the 1-channel instrument and 2 Mbit per channel for the 2-channel instrument
- Pass through pattern for combined and physical and protocol test up to 10 Mbit/s
The Keysight Technoliges, Inc. 81160A Pulse Function Arbitrary Noise Generators set the standard for the next generation of lab: for fast,
accurate insight into your design or device under test. Both of them offer:
- Pulse generators with precise signals for performance verification and characterization
- A function arbitrary generator
- For versatile signal generation to optimize testing
- For modulation to shape the signal the DUT needs
- A noise generator to distort signals to build up worst case scenarios
- An optional pattern generator to test in addition to analog, digital and mixed signal devices with ideal and real-world conditions
The Keysight 81150A and the new Keysight 81160A Pulse Function Arbitrary Noise Generators are indispensable contributors to accelerate ideal and real-world testing.
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