Description

Features and Specifications of Keysight (Agilent/HP) 81160A:

•  1 μHz – 330 MHz pulse generation with variable rise/fall time
•  1 μHz – 500 MHz sine waveform output
•  14-bit, 2.5 GSa/s arbitrary waveforms
•  Up to 256k samples deep arbitrary waveform memory per channel
•  Pulse, sine, square, ramp, noise and arbitrary waveforms
•  Noise, with selectable crest factor, and signal repetition time of 20 days
•  FM, AM, PM, PWM, FSK modulation capabilities
•  1 or 2 channel, coupled and uncoupled
•  Differential outputs
•  Amplitude:
  • 50 Ω into 50 Ω 50 mVPP to 5 VPP
  • 50 Ω into open 100 mVPP to 10 VPP
•  Voltage window:
  • 50 Ω into 50 Ω ± 5 V
  • 50 Ω into open ± 10 V
•  Glitch free change of timing parameters (delay, frequency, transition time, width, duty cycle)
•  Programming language compatible with Keysight 81101A, 81104A, 81105A , 81110A, 81130A and 81150A
•  ISO 17025 and Z540.3 calibration
•  LXI class C (rev 1.1) compliant
•  Optional pattern generator:
•  Ideal and arbitrary bit shaped pattern up to 330 Mbit/s (Option 330) or 660 Mbit/s (Option 660)
•  Two, three or four level signals
•  PRBS up to 231
•  4 Mbit pattern memory for the 1-channel instrument and 2 Mbit per channel for the 2-channel instrument
•  Pass through pattern for combined and physical and protocol test up to 10 Mbit/s

The Keysight Technoliges, Inc. 81160A Pulse Function Arbitrary Noise Generators set the standard for the next generation of lab: for fast,
accurate insight into your design or device under test. Both of them offer:

•  Pulse generators with precise signals for performance verification and characterization
•  A function arbitrary generator
•  For versatile signal generation to optimize testing
•  For modulation to shape the signal the DUT needs
•  A noise generator to distort signals to build up worst case scenarios
•  An optional pattern generator to test in addition to analog, digital and mixed signal devices with ideal and real-world conditions

The Keysight 81150A and the new Keysight 81160A Pulse Function Arbitrary Noise Generators are indispensable contributors to accelerate ideal and real-world testing.