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Keysight (Agilent) 81150A Pulse Function Arbitrary Noise Generator

Keysight (Agilent) 81150A Pulse Function Arbitrary Noise Generator

Description

Features and Specifications of Keysight (Agilent) 81150A:

High precision pulse generators enhanced with versatile signal generation, modulation and
distortion capabilities for:

  •  Accurate signals to test your device and not your signal source
  •  Versatile waveform and noise generation to be ready for today‘s and tomorrow‘s stress test challenges
  •  Optional pattern generator to test in addition to analog, digital and mixed signal devices
  •  Integrated into one instrument to minimize cabling, space and test time
  •  1 μHz – 120 MHz pulse generation with variable rise/fall time
  •  1 μHz – 240 MHz sine waveform output
  •  14-bit, 2 GSa/s arbitrary waveforms
  •  512k samples deep arbitrary waveform memory per channel
  •  Pulse, sine, square, ramp, noise and arbitrary waveforms
  •  Noise, with selectable crest factor, and signal repetition time of 26 days
  •  FM, AM, PM, PWM, FSK modulation capabilities
  •  1 or 2 channel, coupled and uncoupled
  •  Differential outputs
  •  Two selectable output ampliiers:
    •  High bandwidth ampliier
    • Amplitude: 50 mVPP to 5 VPP; 50 Ω into 50 Ω 100 mVpp to 10 VPP; 50 Ω into open
    • Voltage window: ± 5 V; 50 Ω into 50 Ω ± 10 V; 50 Ω into open ± 9 V; 5 Ω into 50 Ω
    •  High voltage amplifier
    • Amplitude: 100 mVPP to 10 VPP; 50 Ω into 50 Ω, 200 mVPP to 20 VPP; 5 Ω into 50 Ω, or 50 Ω into open
    • Voltage window: ± 10 V; 50 Ω into 50 Ω ± 20 V; 5 Ω into 50 Ω or 50 Ω into open
  •  Glitch free change of timing parameters (delay, frequency, transition time, width, duty cycle)
  •  Programming language compatible with Keysight 81101A, 81104A, 81105A, 81110A, 81130A and 81160A
  •  ISO 17025 and Z540.3 calibration
  •  LXI class C (rev. 1.1) compliant
  •  Optional pattern generator:
    •  Ideal and arbitrary bit shaped pattern up to 120 Mbit/s
    •  Two, three or four level signals
    •  PRBS up to 231
    •  16 Mbit pattern memory
    •  Pass through pattern for combined and physical and protocol test up to 10 Mbit/s

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