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Tektronix – TDP1000 1 GHz High Voltage Differential Probes

Tektronix – TDP1000 1 GHz High Voltage Differential Probes

Description

Tektronix – TDP1000 High-voltage Differential Probes provide excellent high-speed electrical and mechanical performance required for today’s Switch Mode Power Supply (SMPS), CAN/LIN Bus, and high-speed digital system designs.

Tektronix – TDP1000 Key performance specifications

  • 1 GHz and 500 MHz probe bandwidth
  • <1 pF differential input capacitance
  • 1 MΩ differential input resistance
  • ±42 v (DC + pk AC) differential input voltage
  • >18 dB CMRR (at 250 MHz 50X attenuation)

Tektronix – TDP1000 Key features

  • Outstanding electrical performance
    • Selectable bandwidth-limiting filters
    • DC reject
  • Versatile DUT connectivity
    • Small compact probe head for probing small geometry circuit elements
    • Straight pin, square pin, solder down, variable pitch standard accessories
    • Robust design for reliability
  • Easy to use
    • Provides automatic units scaling and readout on the oscilloscope display
    • TDP1000, TDP0500
      • Connect directly to oscilloscopes with the TekVPI™ probe interface
      • Easy access to scope-displayed probe menu for probe setup control and operating status information
      • Remote GPIB/USB probe control through the oscilloscope
      • AutoZero – zeros out output offset
    • P6251
      • Connect directly to the TekProbe™ interface oscilloscopes, or to TekConnect® oscilloscopes using TCA-BNC adapter

Tektronix – TDP1000 Applications

  • High-speed switch mode power supply design
  • CAN/LIN bus design
  • Digital design and characterization
  • Manufacturing engineering test
  • Research and development

Tektronix – TDP1000 High-voltage differential probes

The TDP1000, TDP0500, and P6251 High-voltage Differential Probes are specifically designed for use with and direct connection to Tektronix oscilloscopes with either the TekVPI™ probe interface, or TekProbe BNC Interface. These probes achieve high-speed signal acquisition and measurement fidelity by solving three traditional measurement challenges:

  • Outstanding Electrical Performance
  • Versatile Device-Under-Test Connectivity
  • Ease of Use

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