Description
Keysight (Agilent) B1500A Semiconductor Device Parameter Analyzer (Characterization System) Mainframe/EasyEXPERT is a complete solution for characterization of various devices. It supports various measurement capabilities for IV, CV, pulsed IV and fast IV measurement and enables a wide range of electrical characterizations and evaluations for device, material, semiconductor, active/passive component, and any electric devices. Its modular architecture allows you to configure and upgrade the measurement modules up to ten slots according to your test needs at any time. Embedded Windows7 and powerful EasyEXPERT software support efficient and restorable device characterization on the GUI basis operation. Keysight (Agilent) B1500A is the only true parameter analyzer that provides the versatility for a wide range of measurement, uncompromised measurement reliability and test environment for efficient and restorable device characterization.
The Keysight (Agilent) EasyEXPERT is GUI based essential software working on the B1500A embedded Windows7. It supports all aspects of parametric test, from basic IV and CV sweeps to advanced ultra-fast IV and pulsed IV measurements. The ready-to-use hundreds libraries (application tests) make it easy to begin making complicated measurements immediately. The operation is available through the 15-inch wide touch screen in addition to keyboard and mouse operation for ease of use. The EasyEXPERT software also provides efficient test environment for intuitive operation, analysis and exploration in device characterization. The test condition and measurement data re automatically recorded in your workspace, so you can explore to characterize your device without stress.
Keysight (Agilent) EasyEXPERT key features:
- Supports all aspects of parametric test, from basic IV and CV sweeps to advanced ultra-fast IV and pulsed IV measurement
- Hundreds ready to use measurement libraries (application tests)
- Personalized workspace and automated test data recording for device exploration without concerning data file management
- Graph plot display/analysis/printing capabilities for analysis and reporting
- Interactive real-time characterization by knob based curve tracing with the auto-record feature
- Curve tracer test mode on EasyEXPERT provides rotary knob control variable sweep just like a conventional curve tracer
- Oscilloscope View visualizes voltage and current waveforms being applied to the device, therefore assists user to optimize test condition and to observe transient phenomenon of device
- Test sequencing without programming is supported by Quick Test utility
- Classic test mode on EasyEXPERT gives the look, feel and terminology of the Keysight 4155/4156 former parameter analyzer
- Import/Export device definition, measurement settings, my favorite setup, measurement data, and application library
- GUI based switching matrix control panel
- Self-test, self-calibration, diagnostics
Keysight (Agilent/HP) 4155C Features:
- Measurement capabilities
- Current-voltage (IV) measurement capabilities of spot, sweep, sampling and pulse measurement in the range of 0.1 fA – 1 A / 0.5 µV – 200 V
- AC capacitance measurement in multi frequency from 1 kHz to 5 MHz and Quasi-Static Capacitance-Voltage (QS-CV) measurement capabilities
- Advanced pulsed IV and ultra-fast IV measurement capability from minimum 5 ns sampling interval (200 MSa/s)
- Up to 40 V high voltage pulse forcing for non-volatile memory evaluation
- EasyEXPERT software
- Hundreds ready to use measurement libraries (application tests)
- Stress-free exploration by auto-data record enabling restoration of test data and conditions
- Interactive real-time characterization by knob based curve tracing with the auto-record feature
- Maximum usage of instrument by portable, online/off-line capable test environment for test development and analysis (Desktop EasyEXPERT)
- Mainframe features
- Configurable and upgradeable measurement modules up to 10 slots in a box
- 15-inch wide touch screen supports intuitive GUI operation of the EasyEXPERT
- Windows Embedded Standard 7 (WES7)
- GPIB, USB, LAN interfaces, and VGA video output port
Ready to use application libraries
| Device Type | Application Tests |
| CMOS Transistor | Id-Vg, Id-Vd, Vth, breakdown, capacitance, QSCV, etc. |
| Bipolar Transistor | Ic-Vc, diode, Gummel plot, breakdown, hfe, capacitance, etc. |
| Discrete device | Id-Vg, Id-Vd, Ic-Vc, diode, etc. |
| Memory | Vth, capacitance, endurance test, etc. |
| Power device | Pulsed Id-Vg, pulsed Id-Vd, breakdown, etc. |
| Nano Device | Resistance, Id-Vg, Id-Vd, Ic-Vc, etc. |
| Reliability test | NBTI/PBTI, charge pumping, electro migration, hot carrier injection, J-Ramp, TDDB, etc. |
| And more | And more |
Powerful capabilities of EasyEXPERT
| Measurement capabilities | Staircase sweep, multi-channel sweep, pulse sweep, IV sampling, high-speed IV sampling, CV, C-t, C-f, etc. |
| Switching matrix control | B2200, B2201 and E5250 (E5252 card) are supported. |
| Analysis and data display capabilities | List display, X-Y graph (with marker, cursor and line), automatic analysis function, user function, etc. |
| Data management | User workspace management, save/recall measurement data and setting with auto-record feature |
Contact TestWorld today for the best price on the Keysight (Agilent) B1500A Semiconductor Device Parameter Analyzer (Characterization System) Mainframe/EasyEXPERT.
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