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Keysight (Agilent) E8363A 45 MHz to 40 GHz Vector Network Analyzer

Keysight (Agilent) E8363A 45 MHz to 40 GHz Vector Network Analyzer

Product Documentation

Description

The Keysight (Agilent) E8363A 45 MHz to 40 GHz Vector Network Analyzer is a member of the PNA Series network analyzer platform and provides the combination of speed and precision for the demanding needs of today’s high frequency, high-performance component test requirements. The PNA Series meets these testing challenges by providing the right combination of fast sweep speeds, wide dynamic range, low trace noise and flexible connectivity.

The E8363A provides TRL/LRM calibration (four-receiver enabled) for waveguide, on-wafer, and in-fixture devices. Source attenuators, bias-tees and direct receiver access are optionally available for active device and extended dynamic range measurements.

Powerful automation and self-help tools make the instrument well suited for both R&D and manufacturing. The PNA Series feature sixteen independent measurement channels, built-in hard drive and supplied mouse.

Capabilities of the Keysight (Agilent) E8363A:

  • Number of measurement channels: Sixteen independent measurement channels. A measurement channel is coupled to stimulus settings including frequency, IF bandwidth, power level, and number of points.
  • Number of display windows: Up to four display windows. Each window can be sized and re-arranged. Up to four measurement channels can be displayed per window.
  • Number of traces: Up to four active traces and four memory traces per window. Sixteen total active traces and 16 memory traces can be displayed. Measurement traces include S-parameters, as well as relative and absolute power measurements.
  • Measurement choices: S11, S21, S12, S22, A/R1, A/R2, A/B, B/R1, B/R2, B/A, R1/A, R1/B, R1/R2, R2/A, R2/B, R2/R1, A, B, R1, R2
  • Formats: Log or linear magnitude, SWR, phase, group delay, real and imaginary, Smith chart, polar.
  • Data markers: Ten independent markers per trace. Reference marker available for delta marker operation. Marker formats include log or linear magnitude, phase, real, imaginary, SWR, delay, R + jX, and G + jB.
  • Marker functions:
    • Marker search: Maximum value, minimum value, target, next peak, peak right, peak left, target, and bandwidth with user-defined target values
    • Marker-to functions: Set start, stop, and center to active marker stimulus value; set reference to active marker response value; set electrical delay to active marker phase response value.
    • Trace statistics: Calculates and displays mean, standard deviation and peak-to-peak deviation of the data trace.
    • Tracking: Performs new search continuously or on demand.

Specifications of the Keysight (Agilent) E8363A:

  • 45 MHz to 40 GHz
  • 123 dB dynamic range at test port
  • 138 dB dynamic range with direct receiver access
  • 123 dB dynamic range at the test port at 20 GHz
  • < 26 us/point sweep speed
  • COM/DCOM and SCPI programming
  • TRL/LRM calibration supported
  • System IF bandwidth range: 1 Hz to 40 kHz, nominal
  • RF Connectors: 3.5 mm (male), 50 Ω, (nominal), center pin recession flush to .002 in. (characteristic)
  • Display Range:
    • Magnitude ±200 dB (at 20 dB/div), max
    • Phase ±180°, max
    • Polar 10 pico units, min; 1000 units, max
  • Display Resolution:
    • Magnitude: 0.001 dB/div, min
    • Phase: 0.01°/div, min
  • Marker Resolution:
    • Magnitude 0.001 dB, min
    • Phase 0.01°, min
    • Polar 0.01 mUnit, min; 0.01°, min

Contact TestWorld today for the best price on a Keysight (Agilent) E8363A 45 MHz to 40 GHz Vector Network Analyzer.

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Configurable Options for the Keysight (Agilent) E8363A:

  • Time-domain (Option 010): With the time-domain option, data from transmission or reflection measurements in the frequency domain are converted to the time domain using a Fourier transformation technique (chirp Z) and presented on the display. The time-domain response shows the measured parameter value versus time. Markers may also be displayed in electrical length (or physical length if the relative propagation velocity is entered).
    • Time stimulus modes: Two types of time excitation stimulus waveforms can be simulated during the transformations, a step and an impulse.
    • Low-pass step: This stimulus, similar to a traditional time-domain reflectometer (TDR) stimulus waveform, is used to measure low-pass devices. The frequency-domain data should extend from DC (extrapolated value) to a higher value. The step response is typically used for reflection measurements only.
    • Low-pass impulse: This stimulus is also used to measure low-pass devices. The impulse response can be used for reflection or transmission measurements.
    • Bandpass impulse: The bandpass impulse stimulates a pulsed RF signal (with an impulse envelope) and is used to measure the time-domain response of band-limited devices. The start and stop frequencies are selectable by the user to any values within the limits of the test set used. Bandpass time-domain responses are useful for both reflection and transmission measurements.
    • Time-domain range: The “alias-free” range over which the display is free of response repetition depends on the frequency span and the number of points. Range, in nanoseconds, is determined by: Time-domain range = (number of points – 1)/frequency span [in GHz]
    • Range resolution: The time resolution of a time-domain response is related to range as follows: Range resolution = time span/(number of points – 1)
    • Windows: The windowing function can be used to modify (filter) the frequency-domain data and thereby reduce over-shoot and ringing in the time-domain response. Kaiser Beta windows are available.
    • Gating: The gating function can be used to selectively remove reflection or transmission time-domain responses. In converting back to the frequenc ydomain the effects of the responses outside the gate are removed.
  • Configurable test set (Option 014): With the configurable test set option, front panel access loops are provided to the signal path between the source output and coupler input.
    • Extended dynamic range configuration: Reverse the signal path in the coupler and bypass the loss typically associated with the coupled arm. Change the port 2 switch and coupler jumper configurations to increase the forward measurement dynamic range. When making full two-port error corrected measurements, the reverse dynamic range is degraded by 12 to 15 dB.
    • High power measurement configuration: Add external power amplifier(s) between the source output and coupler input to provide up to +30 dBm of power at the test port(s). Full two-port error correction measurements possible. When the DUT output is expected to be greater than +30 dBm, measure directly at the B input and use an external fixed or step attenuator to prevent damage to the receiver. For measurements greater than +30 dBm, add external components such as couplers, attenuators, and isolators.
    • Supplemental performance: Minimum reference channel input level: -35 dBm

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