Description

Tektronix – TDS7254B’ superior measurement fidelity, analysis, and uncompromised usability combine to simplify and speed the design of high-speed, complex systems. This family offers a superior solution to the challenging signal integrity issues faced by designers verifying, characterizing and debugging sophisticated electronic designs. Tektronix’s exclusive DPX(R) acquisition technology enables waveform capture rates up to 400,000 wfms/s to quickly find rare glitches in seconds or minutes, instead of hours or days. Software solutions deliver domain expertise for advanced analysis and compliance testing, while the OpenChoice(R) architecture enables users to integrate their expertise through the ability to easily write custom programs or utilize popular commercial software. The intuitive graphical user interface delivers sophisticated capability to advanced users without intimidating occasional users.

Tektronix – TDS7254B Specifications

• 4 Channel
• 2.5GHz Bandwidth
• 5GS/s Sample Rate in 4 Ch Mode, 10GS/s in 2 Ch Mode, 20GS/s in 1 Ch Mode
• Standard Memory: 1Mpts/ch in 4 Ch Mode, 2Mpts/ch in 2 Ch Mode, 4Mpts/ch in 1 Ch Mode
• 130 ps Rise Time 10% to 90% (Typical), 83ps Rise Time 20% to 80% (Typical)

Tektronix – TDS7254B Applications

• Signal Integrity, Jitter and Timing Analysis
• Verification, Debug and Characterization of Sophisticated Designs
• Design Development and Compliance Testing of Serial Data Streams Up to 2.5 Gbps Rates for Telecom and Datacom Industry Standards
• Spectral Analysis
• Disk Drive Analysis
• Investigation of Transient Phenomena