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Anritsu 37297E 65 GHz Microwave Network Analyzer for Passive Devices

Anritsu 37297E 65 GHz Microwave Network Analyzer for Passive Devices

Description

The Anritsu 37297E 65 GHz Microwave Network Analyzer for Passive Devices encompass a wide range of high performance component and system test tools designed to address the growing needs of defense, satellite, radar, broadband communication, and optoelectronic component markets. Complete measurements solutions to 65 GHz is available in microwave model Anritsu 37297E 65 GHz Microwave Network Analyzer for Passive Devices.

Powerful Applications
Amplifier Testing : – Automatically perform swept power gain compression or swept frequency gain compression.
Mixer Measurements :– Directly measure frequency translation devices utilizing the NxN multiple device solution utility.
Multiport Testing :– Add a multiport test set and perform balanced and differential tests on two or multiport devices.
Optoelectronic Devices :– Measure E/O and O/E devices incorporating the de-embedding routine and photo detector transfer function.
Embedding/De-embedding :– Manipulate S2P networks to automatically remove fixtures and devices or add effects of a known structure.

High Performance Features
Calibration Choices :– A full range of calibration choices from SOLT, offset short, and waveguide to the first commercially available Multiple Line calibration kit for metrology-grade LRL/LRM calibrations.
Adapter Removal Calibration :– Adapters used during calibration are later “removed” for accurate measurements of non-insertable devices.
Multiple Source Control :– Independently control two sources for testing of mixers, multipliers and frequency-translated devices.
Power Meter Correction :– Accurately calibrate the power output of the analyzer for flat, leveled power across the entire frequency sweep.

Standard Features
Measurement Parameters: S11, S21, S22, S12 User-defined combinations of a1, a2, b1, and b2.
Domains: Frequency Domain, CW Draw, and optional High Speed Time (Distance) Domain.
Graph Types: Log Magnitude, Phase, Log Magnitude and Phase, Smith Chart (Impedance), Smith Chart (Admittance), Linear Polar, Log Polar, Group Delay, Linear Magnitude, Linear Magnitude and Phase, Real, Imaginary, Real and Imaginary, SWR, and Power Out.
Data Points: 1601 maximum or N discrete data points where 2 ≤ N ≤ 1601.
Limits Lines: Either single or segmented limit lines can be displayed. Two limit lines are available for each trace.
Single Limit Readouts: Interpolation algorithm determines the exact intersection frequencies of test data and limit lines.
Segmented Limits: A total of 20 segments (10 upper and 10 lower) can be generated per data trace. Complete segmented traces can be offset in both frequency and amplitude.
Test Limits: Both single and segmented limits can be used for PASS/FAIL testing. The active channel’s PASS or FAIL status is indicated on the display after each sweep. In addition, PASS/FAIL status is output through the rear panel I/O connector as selectable TTL levels (PASS = 0V, FAIL = +5V or PASS = +5V, FAIL = 0V).
Tune Mode: Tune Mode optimizes sweep speed in tuning applications by updating forward S-parameters more frequently than reverse ones. This mode allows the user to select the ratio of forward sweeps to reverse sweeps after a full 12-term calibration. The ratio of forward sweeps to reverse sweeps can be set anywhere between 1:1 and 10,000:1.
Data Averaging: Point-by-point (default) {up to 4096}, Sweep-by-Sweep
IF Bandwidth: 10 kHz to 10 Hz

Storage
SD Card Internal Disk: 8 GB, used to store and recall measurement and calibration data and front-panel setups. File names can be 1 to 8 characters long, and must begin with a character, not a number. Extensions are automatically assigned.
Internal Memory: Ten front panel states (no calibration) can be stored and recalled from non-volatile memory locations. The current front panel setup is automatically stored in non-volatile memory at instrument power-down. When power is applied, the instrument returns to its last front panel setup.
Secure Storage: Option 4A, Extra SD Card used to store secure data and operating system.
USB Storage: A USB Type A Storage Port accepts USB Memory Devices ( USB Flash Drives) to load measurement programs and to store/recall measurements, calibration data, and front-panel setups. Measurement data can be stored in text, S2P or bitmap format. File names can be 1 to 8 characters long and must begin with a character, not a number. Extensions are automatically assigned.
Measurement Data: 102.8 kB per 1601 point S-parameter data file.
Calibration Data: 187.3 kB per 1601 point S-parameter data file (12-Term cal plus setup).
Trace Memory File: 12.8 kB per 1601 point channel.

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