Description

Features of the Keysight (Agilent) N5230C:

Capabilities of the Keysight (Agilent) N5230C:

• Mixer Measurements:
  • Conversion loss/gain, magnitude and phase
  • Input match, output match, and LO match
  • Isolation and compression
  • The two internal independent synthesizers with +13 dBm power and < 60 dBc harmonics eliminate the need for external synthesizers or components.
  • Advanced error correction
  • Patented vector-mixer calibration for measurement of absolute group delay
  • Scalar-mixer calibration (SMC) for match-corrected amplitude measurements
  • Signiicantly faster speed for ixed-IF (20 to 30 times faster than with an external source)
  • Easy-to-conigure multi-stage converter measurements
  • LO source control and LO power calibration
  • Mixer IMD
  • The simple two-step SMC calibration provides match-corrected conversion loss, error-corrected input and output match
  • Software tuning for embedded LO
• Amplifier Measurements:
  • Gain, gain latness, reverse isolation, and return loss
  • Simple, fast, and accurate AM-AM and AM-PM compression measurements with the Gain Compression Application with 38 dB power sweep range at 20 GHz, +13 dBm output power
  • Test harmonics accurately with < 60 dBc source harmonics. No need for external filters.
  • Accurate and simple IMD using the dual sources and internal combiner, located behind the couplers, providing highly accurate and stable measurements. No need for external combiners.
  • Source corrected noise igure measurements with exceptional accuracy
  • Integrated source attenuators and receiver attenuators for measurement optimization
  • Perform all of the above measurements with one single connection using the PNA–X.
• Pulsed-RF Measurements:
  • Wideband and narrowband detection
  • Up to four internal pulse generators
  • Up to two internal pulse modulators
  • Pulse widths as narrow as 33 ns
  • Pulse-to-pulse
  • Point-in-pulse, average pulse, and pulse-proile capability
  • No need for external components
• Basic Measurements:
  • Insertion loss, gain, return loss, isolation, group delay, compression, both magnitude and phase
  • Connectorized, in-ixture, or on-wafer
  • Fast and accurate
  • Reliable and repeatable
  • Affordable
• On-wafer Measurements:
  • Class of TRL calibrations for accurate measurements
  • Differential measurement capabilities with integrated multiport network analyzers
  • Accurate power control and de-embedding algorithm for device characterization
  • Compatibility with on-wafer calibration software for a total solution
• Differential Measurements:
  • Single-ended, balanced, mixed-mode
  • S-parameters
  • Ratioed and unratioed measurements
  • Mode-conversion analysis
  • True-mode stimulus measurements
• Multiport Measurements:
  • Multiport conigurations optimized for your device, including full cross-bar
  • Quick-Short-Open-Load-Thru (QSOLT) for fast, multiport cal
  • N-port calibration for accuracy and ease-of-measurements
  • Test-set control part of PNA irmware
  • 32 independent channels for fast measurement speed

Contact TestWorld today for the best price on a Keysight (Agilent) N5230C PNA-L Microwave Network Analyzer.

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Configurable Options for the Keysight (Agilent) N5230C:

• N5230C-020: 300 kHz–6 GHz 2-port standard test set
• N5230C-025: 300 kHz–6 GHz 2-port configurable test set and extended power range
• N5230C-120: 300 kHz–13.5 GHz 2-port standard test set
• N5230C-125: 300 kHz–13.5 GHz 2-port configurable test set and extended power range
• N5230C-140: 300 kHz–13.5 GHz 4-port standard test set
• N5230C-145:300 kHz–13.5 GHz 4-port configurable test set and extended power range
• N5230C-146: 300 kHz–13.5 GHz 4-port configurable test set, extended power range and internal second source (Option 080 recommended)
• N5230C-220: 10 MHz–20 GHz 2-port standard test set
• N5230C-225: 10 MHz–20 GHz 2-port configurable test set and extended power range
• N5230C-240: 300 kHz–20 GHz 4-port standard test set
• N5230C-245: 300 kHz–20 GHz 4-port configurable test set and extended power range
• N5230C-246: 300 kHz–20 GHz 4-port configurable test set, extended power range and internal second source (Option 080 recommended)
• N5230C-420: 10 MHz–40 GHz 2-port standard test set
• N5230C-425: 10 MHz–40 GHz 2-port configurable test set and extended power range
• N5230C-520: 10 MHz–50 GHz 2-port standard test set
• N5230C-525: 10 MHz–50 GHz 2-port configurable test set and extended power range

• N5231C-010: Time domain for 6 GHz model
• N5230C-010: Time domain for 13.5, 20, 40 or 50 GHz model
• N5230C-080: Frequency offset measurements
• N5230C-082: Scalar-calibrated converter measurements (Option 080 required)
• N5230C-550: 4-port measurement application (Not available on 4-port models. Requires test set Option xx5 or xx6)
• N5231C-551: N-port capabilities for 6, 13.5 or 20 GHz model (Requires test set Option xx5 or xx6)
• N5230C-551:N-port capabilities for 40 or 50 GHz model (Requires test set Option xx5 or xx6)